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Physical Review Letters

Volumn 89, Issue 13, 2002, Pages

Experimental Persistence Probability for Fluctuating Steps

(6) Dougherty, D B a Lyubinetsky, I a Williams, E D a Constantin, M b Dasgupta, C b Das Sarma, S b

a UNIVERSITY OF MARYLAND (United States)

b Bldg 142 (United States)

Author keywords

[No Author keywords available]

Indexed keywords

IMAGE ANALYSIS; LIQUID CRYSTALS; NANOSTRUCTURED MATERIALS; PROBABILITY; SCANNING TUNNELING MICROSCOPY; SILICON;

LANGEVIN EQUATIONS;

SURFACE PHENOMENA;

EID: 0037163790 PISSN: 00319007 EISSN: 10797114 Source Type: Journal
DOI: 10.1103/PhysRevLett.89.136102 Document Type: Article

Times cited : (71)

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