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Volumn , Issue , 2008, Pages 873-878

Inverter power drive transistor diagnostic and extended operation under one-transistor trigger suppression

Author keywords

[No Author keywords available]

Indexed keywords

CONTROL METHODS; DIAGNOSTIC METHODS; DRIVE SYSTEMS; ELECTRICAL OVER-STRESS; ELECTRICAL POWER; EXTERNAL-; FAULT-ACCOMMODATION; POWER TRANSISTORS; STEADY-STATE CONDITIONS;

EID: 49249136521     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/APEC.2008.4522823     Document Type: Conference Paper
Times cited : (7)

References (15)
  • 1
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    • Investigation of fault modes of voltage-fed inverter system for induction motor drive
    • Jul/Aug
    • Kastha, D. Bose, B.K "Investigation of fault modes of voltage-fed inverter system for induction motor drive" IEEE Trans. on Ind. Appl., Jul/Aug 1994 Vol. 30, No 4, 1028-1038.
    • (1994) IEEE Trans. on Ind. Appl , vol.30 , Issue.4 , pp. 1028-1038
    • Kastha, D.1    Bose, B.K.2
  • 2
    • 3843127550 scopus 로고    scopus 로고
    • Fault tolerant three-phase AC motor drive topologies: A comparison of features, cost, and limitations
    • July
    • Welchko, B.A. Lipo, T.A. Jahns, T.M. Schulz, S.E. "Fault tolerant three-phase AC motor drive topologies: a comparison of features, cost, and limitations" IEEE Trans. on Power Electronics, July 2004, Vol. 19, No 4, 1108-1116.
    • (2004) IEEE Trans. on Power Electronics , vol.19 , Issue.4 , pp. 1108-1116
    • Welchko, B.A.1    Lipo, T.A.2    Jahns, T.M.3    Schulz, S.E.4
  • 3
    • 0028480661 scopus 로고
    • Fault mode single-phase operation of a variable frequency induction motor drive and improvement of pulsating torque characteristics
    • Aug
    • Kastha, D. Bose, B.K. 'Fault mode single-phase operation of a variable frequency induction motor drive and improvement of pulsating torque characteristics", IEEE Transactions on Industrial Electronics, Aug 1994, VoL.: 41, No:4, 426-433.
    • (1994) IEEE Transactions on Industrial Electronics , vol.41 , Issue.4 , pp. 426-433
    • Kastha, D.1    Bose, B.K.2
  • 5
    • 0003717637 scopus 로고    scopus 로고
    • Reliability of Solder Die Attaches for High Power Application,
    • Masters thesis, Dept. Mech. Eng, Univ. Maryland, College Park, MD
    • P. Srinivasan, "Reliability of Solder Die Attaches for High Power Application," Masters thesis, Dept. Mech. Eng., Univ. Maryland, College Park, MD, 2000.
    • (2000)
    • Srinivasan, P.1
  • 6
    • 49249098669 scopus 로고    scopus 로고
    • Thermal Characterization of DieAttach Degradation in the Power MOSFET
    • PhD thesis Virginia Polytechnic Institute
    • D.C. Katsis "Thermal Characterization of DieAttach Degradation in the Power MOSFET" PhD thesis Virginia Polytechnic Institute. 2003.
    • (2003)
    • Katsis, D.C.1
  • 8
    • 48349115036 scopus 로고    scopus 로고
    • M. A. Rodríguez1, A.Claudio, D. Theilliol, and L. G. Vela A New Fault Detection Technique for IGBT Based on Gate Voltage Monitoring PESC 2007, pp. 1000-1005.
    • M. A. Rodríguez1, A.Claudio, D. Theilliol, and L. G. Vela "A New Fault Detection Technique for IGBT Based on Gate Voltage Monitoring" PESC 2007, pp. 1000-1005.
  • 10
    • 48049087668 scopus 로고    scopus 로고
    • On-line Ringing Characterization as a PHM Technique for Power Drives and Electrical Machinery
    • A. E. Ginart, D. Brown, P. W. Kalgren and M.J. Roemer "On-line Ringing Characterization as a PHM Technique for Power Drives and Electrical Machinery", IEEE AUTOTESTCON 2007, pp.654-659.
    • (2007) IEEE AUTOTESTCON , pp. 654-659
    • Ginart, A.E.1    Brown, D.2    Kalgren, P.W.3    Roemer, M.J.4
  • 12
    • 49249093205 scopus 로고    scopus 로고
    • Maquinas Eléctricas Rotativas
    • J. M. Aller, "Maquinas Eléctricas Rotativas" Equinoccio, 2007.
    • (2007) Equinoccio
    • Aller, J.M.1
  • 13
    • 49249094076 scopus 로고    scopus 로고
    • Atamel, AVR495, AC Induction Motor Control Using the Constant V/f Principle and a Space-vector PWM Algorithm, 2005.
    • Atamel, AVR495, "AC Induction Motor Control Using the Constant V/f Principle and a Space-vector PWM Algorithm", 2005.
  • 14
    • 0348042951 scopus 로고    scopus 로고
    • Electron transport through broken down ultra-thin SiO2 layers in MOS devices
    • Miranda, E. and Sune', J., "Electron transport through broken down ultra-thin SiO2 layers in MOS devices", Microelectronics Reliability, Vol. 44, pp. 1-23. 2004.
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.