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Volumn 40, Issue 10, 2008, Pages 919-930

Multiple fault signature integration and enhancing for variation source identification in manufacturing processes

Author keywords

Eigenprojection; Fault diagnosis; Fault signature; Integrated signature

Indexed keywords

ELECTRIC FAULT LOCATION; INDUSTRIAL ENGINEERING; NUMERICAL ANALYSIS; PRODUCTION ENGINEERING;

EID: 49249116186     PISSN: 0740817X     EISSN: 15458830     Source Type: Journal    
DOI: 10.1080/07408170801961404     Document Type: Article
Times cited : (11)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.