Identifying spatial variation patterns in multivariate manufacturing processes

Technometrics

Volumn 45, Issue 3, 2003, Pages 220-234

  Apley, Daniel W ^a   Lee, Ho Young ^a  

^a Texas AandM University   (United States)

Author keywords

Blind source separation; Factor rotation; Manufacturing variation reduction; Multivariate statistical process control; Principal components analysis

Indexed keywords

BLIND SOURCE SEPARATION; DATA REDUCTION; MANUFACTURING DATA PROCESSING; MULTIVARIABLE SYSTEMS; PATTERN RECOGNITION; PRINCIPAL COMPONENT ANALYSIS; SENSOR DATA FUSION; SIGNAL PROCESSING;

SPATIAL VARIATION PATTERNS;

STATISTICAL PROCESS CONTROL;

EID: 0042125049     PISSN: 00401706     EISSN: 15372723     Source Type: Journal    
DOI: 10.1198/004017003000000041     Document Type: Article

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