Signature construction and matching for fault diagnosis in manufacturing processes through fault space analysis

IIE Transactions (Institute of Industrial Engineers)

Volumn 38, Issue 4, 2006, Pages 341-354

  Jin, Nong ^a   Zhou, Shiyu ^a  

^a University of Wisconsin Madison   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FAULT TOLERANT COMPUTER SYSTEMS; LINEAR EQUATIONS; MATHEMATICAL MODELS; MATRIX ALGEBRA; PATTERN MATCHING;

COVARIANCE MATRIX; PROCESS FAULTS; PRODUCT QUALITY; QUALITY MEASUREMENTS; VARIATION-SOURCE IDENTIFICATION;

PROCESS ENGINEERING;

EID: 33644633637     PISSN: 0740817X     EISSN: None     Source Type: Journal    
DOI: 10.1080/07408170500216498     Document Type: Article

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