Enhancement of the superconducting transition temperature of La2-xSrxCuO4 bilayers: Role of pairing and phase stiffness

Physical Review Letters

Volumn 101, Issue 5, 2008, Pages

  Yuli, Ofer ^a   Asulin, Itay ^a   Millo, Oded ^a   Orgad, Dror ^a   Iomin, Leonid ^b   Koren, Gad ^b  

^a HEBREW UNIVERSITY OF JERUSALEM   (Israel)

^b TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); CRITICAL CURRENTS; ELECTRIC CONDUCTIVITY; PENETRATION DEPTH (SUPERCONDUCTIVITY); PHASE INTERFACES; STIFFNESS; SUPERCONDUCTING FILMS; SUPERCONDUCTIVITY; TECHNETIUM; VORTEX FLOW;

BI-LAYERS; DOPING LEVELS; LA2-XSRXCUO4; PHASE STIFFNESS; SUPERCONDUCTING TRANSITIONS; UNDER-DOPED FILMS;

SUPERCONDUCTING TRANSITION TEMPERATURE;

EID: 49149126698     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.101.057005     Document Type: Article

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