Scanning tunneling spectroscopy characterization of the pseudogap and the x= 1 8 anomaly in La2-x Srx Cu O4 thin films

Physical Review B - Condensed Matter and Materials Physics

Volumn 75, Issue 18, 2007, Pages

  Yuli, Ofer ^a   Asulin, Itay ^a   Millo, Oded ^a   Koren, Gad ^b  

^a HEBREW UNIVERSITY OF JERUSALEM   (Israel)

^b TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 34347401473     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.75.184521     Document Type: Article

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