Reflection-time-of-flight spectrometer for two-electron (e,2e) coincidence spectroscopy on surfaces

Review of Scientific Instruments

Volumn 79, Issue 7, 2008, Pages

  Kirschner, J ^a   Kerherve G ^a   Winkler, C ^a  

^a MAX PLANCK INSTITUTE OF MICROSTRUCTURE PHYSICS   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON ENERGY LEVELS; ELECTRONS; FLUORINE COMPOUNDS; KINETIC ENERGY; KINETICS; LITHIUM COMPOUNDS; NEUTRON SPECTROMETERS;

COINCIDENCE SPECTROSCOPY; CORRELATION SPECTROSCOPY; ELECTRON ENERGIES; EMITTED ELECTRON; ENERGY RESOLUTIONS; MULTICHANNEL PLATES; REFLECTION TIME; TIME-OF-FLIGHT SPECTROMETER;

ELECTRON EMISSION;

EID: 49149101907     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2949869     Document Type: Article

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