Secondary-electron emission mechanism of LiF film by (e,2e) spectroscopy

Surface Science

Volumn 548, Issue 1-3, 2004, Pages 187-199

  Samarin, S ^a   Berakdar, J ^b   Suvorova, A ^a   Artamonov, O M ^c   Waterhouse, D K ^a   Kirschner, J ^b   Williams, J F ^a  

^a UNIVERSITY OF WESTERN AUSTRALIA   (Australia)

^b MAX PLANCK INSTITUTE OF MICROSTRUCTURE PHYSICS   (Germany)

^c ST PETERSBURG STATE UNIVERSITY   (Russian Federation)

Author keywords

Alkali halides; Electron solid interactions, scattering, diffraction; Insulating films; Secondary electron emission

Indexed keywords

DEPOSITION; DIFFRACTION; INSULATING MATERIALS; SCATTERING; SECONDARY EMISSION; SILICON; SPECTROSCOPIC ANALYSIS; SURFACE STRUCTURE; THIN FILMS;

ELECTRON-SOLID INTERACTIONS; ENERGY-DISTRIBUTION CURVES (EDC); INSULATING FILMS;

LITHIUM COMPOUNDS;

EID: 0348042168     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2003.11.003     Document Type: Article

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