Electron beam induced alteration of LiF thin films monitored by EELS

Solid State Communications

Volumn 110, Issue 3, 1999, Pages 143-146

  Golek, F ^a   Sobolewski, W J ^a  

^a UNIVERSITY OF WROC AW   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

AGGLOMERATION; CRYSTAL DEFECTS; DEPOSITION; DIFFUSION IN SOLIDS; ELECTRON BEAMS; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRONIC DENSITY OF STATES; ENERGY GAP; LITHIUM COMPOUNDS; SEMICONDUCTING SILICON; SINGLE CRYSTALS;

LITHIUM FLUORIDE;

SEMICONDUCTING FILMS;

EID: 0344240931     PISSN: 00381098     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0038-1098(99)00042-3     Document Type: Article

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