Degradation factor analysis of cRYSTALLINE-Si PV modules through long-term field exposure TEST

Proceedings of the 3rd World Conference on Photovoltaic Energy Conversion

Volumn B, Issue , 2003, Pages 1948-1951

  Morita, Kengo ^a   Inoue, Takamitsu ^a   Kato, Hiroshi ^a   Tsuda, Izumi ^b   Hishikawa, Yoshihiro ^b  

^a Japan Elec Safety/Environ TL   (Japan)

^b NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRODE SOLDERING; LONG-TERM RELIABILITY; SERIES RESISTANCE; SOLAR SIMULATORS;

CRYSTALLINE MATERIALS; DISCOLORATION; ELECTRIC POTENTIAL; PHOTODEGRADATION; RELIABILITY; SILICON SOLAR CELLS;

PHOTOVOLTAIC CELLS;

EID: 6344277214     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)

1. th IEEE Photovoltaic Specialists Conf. (1997), p 1117
2. th IEEE Photovoltaic Specialists Conf. (2000), p 1487
3. th EU Photovoltaic Solar Energy Conf. (2000), p2280
4. th IEEE Photovoltaic Specialists Conf. (2002), p1436
5. K. Morita, Y, Hishikawa et al., Proceedings of JSES/JWEA Joint Conf. (2000), p287 (in Japanese)