Optical properties study of PLZT films deposited on sapphire Substrate

Vacuum

Volumn 82, Issue 12, 2008, Pages 1495-1498

  Khodorov, A ^a   Gomes, M J M ^a  

^a UNIVERSITY OF MINHO   (Portugal)

Author keywords

Optical properties; PLZT; Sol gel processes; Structure properties

Indexed keywords

ABSORPTION; AMORPHOUS MATERIALS; COLLOIDS; CORUNDUM; GELATION; LANTHANUM; MOLECULAR BEAM EPITAXY; OPTICAL DESIGN; OPTICAL PROPERTIES; PARAMETER ESTIMATION; PLASMA DIAGNOSTICS; REFRACTIVE INDEX; SAPPHIRE; SEMICONDUCTING CADMIUM TELLURIDE; SOL-GEL PROCESS; THICK FILMS;

ABSORPTION EDGES; BAND TAILING; CELL PARAMETERS; DIELECTRIC FUNCTIONS; ENVELOPE METHOD; FILM-THICKNESS; INDEX N; LANTHANUM-MODIFIED LEAD ZIRCONATE TITANATE; OPTICAL TRANSMISSION SPECTRUM; PLZT; PLZT FILMS; POLY-CRYSTALLINE; SAPPHIRE SUBSTRATES; SOL-GEL METHODS; SOL-GEL PROCESSES; STRUCTURE PROPERTIES; THIN FILMS; WHOLE-PATTERN FITTING;

AMORPHOUS FILMS;

EID: 49149087875     PISSN: 0042207X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.vacuum.2008.03.006     Document Type: Article

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