Infrared spectroscopic ellipsometry of (Pb, La)(Zr, Ti)O3 thin films on platinized silicon

Physics Letters, Section A: General, Atomic and Solid State Physics

Volumn 320, Issue 5-6, 2004, Pages 478-486

  Hu, Z G ^a   Shi, F W ^a   Lin, T ^a   Huang, Z M ^a   Wang, G S ^a   Wu, Y N ^a   Chu, J H ^a  

^a SHANGHAI INSTITUTE OF TECHNICAL PHYSICS   (China)

Author keywords

Effective static charge; Infrared detectors; Infrared optical properties; La concentrations; Lead lanthanum zirconate titanate; Spectroscopic ellipsometry

Indexed keywords

FERROELECTRIC FILMS; FILM PREPARATION; INFRARED DETECTORS; LANTHANUM COMPOUNDS; LEAD COMPOUNDS; LIGHT ABSORPTION; MULTILAYER FILMS; OPTICAL MULTILAYERS; REFRACTIVE INDEX; SILICON; SOL-GEL PROCESS; SOL-GELS; SPECTROSCOPIC ELLIPSOMETRY; X RAY POWDER DIFFRACTION;

EXTINCTION COEFFICIENTS; INFRARED DETECTORS AND FOCAL PLANE ARRAYS; INFRARED OPTICAL ABSORPTION; INFRARED OPTICAL PROPERTIES; INFRARED SPECTROSCOPIC ELLIPSOMETRY; LEAD LANTHANUM ZIRCONATE TITANATE; MODIFIED SOL-GEL METHOD; STATIC CHARGE;

THIN FILMS;

LANTHANUM; LEAD; SILICON; TITANIUM; ZIRCONIUM;

ARTICLE; CALCULATION; CHEMICAL COMPOSITION; COVALENT BOND; ELLIPSOMETRY; FILM; INFRARED SPECTROSCOPY; POLARIMETRY; THICKNESS; WAVEFORM; X RAY DIFFRACTION;

EID: 0347285493     PISSN: 03759601     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physleta.2003.12.003     Document Type: Article

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