The effect of strain and strain symmetry on the charge-order transition in Bi0.4Ca0.6MnO3 films

Phase Transitions

Volumn 81, Issue 7-8, 2008, Pages 717-727

  Christen, Hans M ^a   Varela, Maria ^a   Kim, Dae Ho ^a  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

Bismuth manganite; Charge order; Epitaxial strain; Thin films

Indexed keywords

BISMUTH PLATING; DEFECT STRUCTURES; EPITAXIAL FILMS; EPITAXIAL GROWTH; FERROMAGNETISM; OXIDE MINERALS; PHASE TRANSITIONS; SUBSTRATES; THICK FILMS;

AT PHASE; BI-BASED; BISMUTH MANGANITE; CHARGE ORDER; CHARGE-ORDER TRANSITIONS; EFFECT OF STRAIN; EFFECTS OF STRAIN; EPITAXIAL MANGANITE FILMS; EPITAXIAL STRAIN; EPITAXIAL STRAINS; HIGH RESOLUTIONS; LATTICE STRAINS; MAGNETIZATION DATA; MANGANITE FILMS; PSEUDOCUBIC; SPONTANEOUS FORMATION; STRAIN SYMMETRY; THIN FILMS; TRANSITION TEMPERATURES; TRANSMISSION MICROSCOPY; UNIT CELLS; X-RAY DIFFRACTION; Z-CONTRAST SCANNING;

MOLECULAR BEAM EPITAXY;

EID: 49149083250     PISSN: 01411594     EISSN: 10290338     Source Type: Journal    
DOI: 10.1080/01411590802048307     Document Type: Review

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