Spectromicroscopic investigation of polymer light-emitting device degradation

Organic Electronics

Volumn 9, Issue 5, 2008, Pages 869-872

  Chung, Jaegwan ^a   Kim, Ki Hong ^a   Lee, J C ^a   Kim, M K ^a   Shin, H J ^b  

^a Samsung Advanced Institute of Technology (SAIT)   (South Korea)

^b Pohang University of Science and Technology (POSTECH)   (South Korea)

Author keywords

PEDOT:PSS based PLED; PLED degradation; Polymer light emitting devices (PLEDs); X ray scanning photoelectron microscopy (SPEM)

Indexed keywords

CONDUCTING POLYMERS; CURRENT DENSITY; DEGRADATION; LIGHT EMISSION; PHOTODEGRADATION; PHOTOELECTRON SPECTROSCOPY; PHOTOELECTRONS; PHOTONS; SULFUR COMPOUNDS; X RAYS;

DEGRADATION MECHANISM; ISLAND-LIKE STRUCTURES; PEDOT:PSS BASED PLED; PLED DEGRADATION; POLY(3 ,4-ETHYLENEDIOXYTHIOPHENE)-POLY(4-STYRENESULFONATE) (PEDOT-PSS); POLYMER LIGHT EMITTING DEVICE; POLYMER LIGHT-EMITTING DEVICES; X-RAY SCANNING PHOTOELECTRON MICROSCOPIES;

ORGANIC LIGHT EMITTING DIODES (OLED);

EID: 49049099785     PISSN: 15661199     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.orgel.2008.06.009     Document Type: Article

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