The effect of cold expansion on the fatigue life of the chamfered holes

Journal of Engineering Materials and Technology

Volumn 130, Issue 3, 2008, Pages 0310141-0310147

  Jang, Jae Soon ^a   Kim, Dave ^a   Cho, Myoung Rae ^b  

^a WASHINGTON STATE UNIVERSITY   (United States)

^b Lnduk Institute of Technology   (South Korea)

Author keywords

Cold expansion method; Fatigue life; Finite element analysis; Hole chamfer; Residual stress; X ray diffraction

Indexed keywords

AIRCRAFT MANUFACTURE; AIRFRAMES; FATIGUE TESTING; FINITE ELEMENT METHOD; RESIDUAL STRESSES; STRESS CONCENTRATION; X RAY DIFFRACTION;

COLD EXPANDED HOLES; COLD EXPANSION METHOD; COLD EXPANSION PROCESS; COMPRESSIVE RESIDUAL STRESS; FATIGUE CRACK INITIATION; HOLE CHAMFER; NUMERICAL AND EXPERIMENTAL STUDY; X-RAY DIFFRACTION MEASUREMENTS;

FATIGUE OF MATERIALS;

EID: 48849088322     PISSN: 00944289     EISSN: None     Source Type: Journal    
DOI: 10.1115/1.2931156     Document Type: Article

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