Crystal structure refinement of the ternary compound Cu 2SnTe3 by X-ray powder diffraction

Crystal Research and Technology

Volumn 43, Issue 4, 2008, Pages 433-437

  Delgado, G E ^a   Mora, A J ^a   Marcano, G ^a   Rincon C ^a  

^a UNIVERSIDAD DE LOS ANDES   (Venezuela)

Author keywords

Chalcogenide compound; Crystal structure; Rietveld refinement; X ray powder diffraction

Indexed keywords

COPPER; DIFFRACTION; POWDERS; RIETVELD METHOD; RIETVELD REFINEMENT; TERNARY ALLOYS; TERNARY SYSTEMS; THREE DIMENSIONAL; X RAY POWDER DIFFRACTION;

CRYSTAL STRUCTURE REFINEMENTS; INDEPENDENT REFLECTIONS; ISOSTRUCTURAL; POWDER DIFFRACTIONS; SPACE GROUPS; TERNARY COMPOUNDS;

CRYSTAL STRUCTURE;

EID: 48749100500     PISSN: 02321300     EISSN: 15214079     Source Type: Journal    
DOI: 10.1002/crat.200711049     Document Type: Article

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