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Volumn 397, Issue 1-2, 2005, Pages 169-172
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X-ray powder diffraction refinement of Cu2ZnGeTe4 structure and phase diagram of the Cu2GeTe3-ZnTe system
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Author keywords
Crystal structure; Phase diagram; Semiconductors; X ray diffraction
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Indexed keywords
ANNEALING;
CRYSTAL STRUCTURE;
GERMANIUM;
LATTICE CONSTANTS;
PHASE DIAGRAMS;
SYNTHESIS (CHEMICAL);
X RAY DIFFRACTION;
ZINC;
ATOMIC PARAMETERS;
HOMOGENIZING ANNEALING;
ORTHORHOMBIC SPACE GROUPS;
TETRAGONAL SPACE GROUPS;
COPPER ALLOYS;
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EID: 19744377300
PISSN: 09258388
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jallcom.2005.01.032 Document Type: Article |
Times cited : (23)
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References (22)
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