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Volumn 1, Issue , 2007, Pages 35-40

Quasi ballistic transport in advanced MOSFET devices

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CONDUCTIVITY; EXPLOSIVES; MOSFET DEVICES; SEMICONDUCTOR MATERIALS; TRANSPORT PROPERTIES;

EID: 48549086223     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/SMICND.2007.4519642     Document Type: Conference Paper
Times cited : (1)

References (21)
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    • 48549089214 scopus 로고    scopus 로고
    • ITRS Public Home Page
    • ITRS Public Home Page.
  • 6
    • 0033712947 scopus 로고    scopus 로고
    • MOSFET Modeling Into the Ballistic Regime
    • D. Bude, «MOSFET Modeling Into the Ballistic Regime», Proc. SISPAD 2000.
    • (2000) Proc. SISPAD
    • Bude, D.1
  • 10
    • 48549087511 scopus 로고    scopus 로고
    • M. Ferrier et al. Proc. SNW, to appear in IEEE Trans. Nanotechnology, 2006.
    • M. Ferrier et al. Proc. SNW, to appear in IEEE Trans. Nanotechnology, 2006.
  • 11
    • 48549084863 scopus 로고    scopus 로고
    • A. Pethe et al, Proc. IEDM, p. 605, 2005.
    • A. Pethe et al, Proc. IEDM, p. 605, 2005.
  • 17
    • 46049103673 scopus 로고    scopus 로고
    • in Proc
    • Washington, p
    • L. Lucci et al., in Proc IEDM, Washington, p. 617, 2005.
    • (2005) IEDM , pp. 617
    • Lucci, L.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.