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Volumn 56, Issue 15, 2008, Pages 4002-4011
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Origin of intragranular crystallographic misorientations in hot-dip Al-Zn-Si coatings
a
EPFL
(Switzerland)
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Author keywords
Al Zn; Crystallographic misorientations; Hot dipping; Solidification microstructures; Solidification shrinkage
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Indexed keywords
AGRICULTURAL PRODUCTS;
ALUMINUM;
ATOMIC FORCE MICROSCOPY;
ATOMIC SPECTROSCOPY;
CLADDING (COATING);
COATINGS;
CRYSTALLIZATION;
DENDRITES (METALLOGRAPHY);
EMISSION SPECTROSCOPY;
INDUSTRIAL EMISSIONS;
IRON;
LITHOGRAPHY;
MICROCRYSTALLINE SILICON;
MICROSCOPIC EXAMINATION;
MOLECULAR SPECTROSCOPY;
OPTICAL EMISSION SPECTROSCOPY;
OPTICAL MICROSCOPY;
OXIDE FILMS;
SCANNING PROBE MICROSCOPY;
SHRINKAGE;
SILICON;
SOLIDIFICATION;
STRESSES;
ZINC;
ATOMIC FORCE MICROSCOPY (AFM);
CRYSTALLOGRAPHIC ORIENTATIONS;
DENDRITE ARMS;
DENDRITIC STRUCTURES;
DRIVING FORCES;
ELECTRON BACK-SCATTERED DIFFRACTION (EBSD);
EXPERIMENTAL DATA;
GLOW-DISCHARGE OPTICAL EMISSION SPECTROSCOPY (DG-OES);
INDIVIDUAL (PSS 544-7);
INDUSTRIAL PRODUCTION (IP);
MECHANICAL LOADINGS;
MISORIENTATIONS;
PHASE FIELD SIMULATIONS;
SOLIDIFICATION MICROSTRUCTURES;
SOLIDIFICATION SHRINKAGE;
STEEL PLATES;
VARIATIONS OF;
IMAGING TECHNIQUES;
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EID: 48449087980
PISSN: 13596454
EISSN: None
Source Type: Journal
DOI: 10.1016/j.actamat.2008.04.037 Document Type: Article |
Times cited : (15)
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References (23)
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