Quantitative phase analysis of bentonites by the rietveld method

Clays and Clay Minerals

Volumn 56, Issue 2, 2008, Pages 272-282

  Ufer, Kristian ^a   Stanjek, H ^b   Roth, G ^b   Dohrmann, R ^c   Kleeberg, R ^d   Kaufhold, S ^c  

^a TU BERGAKADEMIE FREIBERG   (Germany)

^b RWTH AACHEN UNIVERSITY   (Germany)

^c FEDERAL INSTITUTE FOR GEOSCIENCES AND NATURAL RESOURCES BGR   (Germany)

^d NONE

Author keywords

Bentonite; Quantification; Rietveld analysis; Smectite

Indexed keywords

ARSENIC; ARSENIC COMPOUNDS; BENTONITE; CHEMICAL ANALYSIS; CLAY; CLAY MINERALS; CORUNDUM; DIFFRACTION; GARNETS; GEOLOGIC MODELS; HEMATITE; HOLOGRAPHIC INTERFEROMETRY; MINERALOGY; RIETVELD ANALYSIS; RIETVELD METHOD; SILICA; SILICATE MINERALS; STANDARDS; SULFATE MINERALS; X RAY ANALYSIS;

BULK MATERIALS; CHEMICAL COMPOSITIONS; INTERNAL STANDARD (IS); QUANTITATIVE ANALYSIS; QUANTITATIVE PHASE ANALYSIS; RIETVELD; SMECTITE; SMECTITES; STRUCTURE MODELING; TURBOSTRATIC; VOLCANIC GLASSES; X-RAY AMORPHOUS; X-RAY DIFFRACTION (XRD) PATTERNS; X-RAY FLUORESCENCE (XFA);

MINERALS;

BENTONITE; CHEMICAL COMPOSITION; MODELING; RIETVELD ANALYSIS; SMECTITE; X-RAY DIFFRACTION; X-RAY FLUORESCENCE;

EID: 48249137725     PISSN: 00098604     EISSN: None     Source Type: Journal    
DOI: 10.1346/CCMN.2008.0560210     Document Type: Article

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