Rietveld analysis of disordered layer silicates

Materials Science Forum

Volumn 278-281, Issue PART 1, 1998, Pages 300-305

  Bergmann, J ^a   Kleeberg, R ^b  

^a Ludwig Renn Allee 14   (Germany)

^b TU BERGAKADEMIE FREIBERG   (Germany)

Author keywords

Disorder; Layer Silicates; Quantitative Analysis; Rietveld Analysis

Indexed keywords

CHLORITE MINERALS; KAOLIN; MATHEMATICAL MODELS; X RAY DIFFRACTION ANALYSIS; CHEMICAL ANALYSIS; KAOLINITE; RIETVELD ANALYSIS;

RIETVELD ANALYSIS;

SILICATES;

DISORDER; DISORDERED STRUCTURES; INTEGRATED STRUCTURE; LAYER SILICATE; XRD PATTERNS;

EID: 0031629255     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/msf.278-281.300     Document Type: Article

References (8)

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