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Volumn 16, Issue 7, 2008, Pages 922-926

Complex shaped on-wafer interconnects modeling for CMOS RFICs

Author keywords

CMOS radio frequency integrated circuits (RFICs); Equivalent circuit model; Interconnects; On wafer measurements

Indexed keywords

COMPUTER AIDED DESIGN; INTERCONNECTION NETWORKS;

EID: 48149100941     PISSN: 10638210     EISSN: None     Source Type: Journal    
DOI: 10.1109/TVLSI.2008.2000445     Document Type: Article
Times cited : (2)

References (7)
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    • (2004) Proc. IEEE RAWCON , pp. 95-98
    • Shi, X.1    Ma, J.2    Ong, B.H.3    Yeo, K.S.4    Do, M.A.5    Li, E.6
  • 2
    • 27844448067 scopus 로고    scopus 로고
    • Equivalent circuit model of on-wafer CMOS interconnects for RFlCs
    • Sep
    • X. Shi, J. Ma, K. S. Yeo, M. A. Do, and E. Li, "Equivalent circuit model of on-wafer CMOS interconnects for RFlCs," IEEE Trans. Very Large Scale Integr. (VLSI) Syst., vol. 13, no. 9, pp. 1060-1071, Sep. 2005.
    • (2005) IEEE Trans. Very Large Scale Integr. (VLSI) Syst , vol.13 , Issue.9 , pp. 1060-1071
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  • 3
    • 33747557398 scopus 로고    scopus 로고
    • High-performance interconnects: An integration overview
    • May
    • R. H. Havemann and J. A. Hutchby, "High-performance interconnects: An integration overview," Proc. IEEE, vol. 89, no. 5, pp. 586-601, May 2001.
    • (2001) Proc. IEEE , vol.89 , Issue.5 , pp. 586-601
    • Havemann, R.H.1    Hutchby, J.A.2
  • 6
    • 20144381330 scopus 로고    scopus 로고
    • High frequency characterization and modeling of on-chip interconnects and RFIC wire bonds,
    • Ph.D. dissertation, Dept. Elect. Eng, Stanford University, Stanford, CA
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    • (2001)
    • Qi, X.1
  • 7
    • 0026908091 scopus 로고
    • S-parameter-based IC interconnect transmission line characterization
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    • W. R. Eisenstadt and Y. Eo, "S-parameter-based IC interconnect transmission line characterization," IEEE Trans. Compon., Hybrids, Manuf Technol., vol. 15, no. 4, pp. 483-490, Aug. 1992.
    • (1992) IEEE Trans. Compon., Hybrids, Manuf Technol , vol.15 , Issue.4 , pp. 483-490
    • Eisenstadt, W.R.1    Eo, Y.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.