Parallel test description and analysis of parallel test system speedup through Amdahl's Law

AUTOTESTCON (Proceedings)

Volumn , Issue , 2007, Pages 735-740

  Waivio, Nathan ^a  

^a NORTHROP GRUMMAN CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIRECTED GRAPHS; INTEGRATED DIAGNOSTICS; MULTIPLE TESTING; PARALLEL TESTING; PARALLELIZING; TEST INFORMATION; TEST SYSTEMS; UNITS-UNDER-TEST; XML-BASED STANDARDS;

COMPUTER SCIENCE; GRAPH THEORY; LAWS AND LEGISLATION; MARKUP LANGUAGES; STANDARDS; TECHNOLOGY;

TESTING;

EID: 48049090272     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/AUTEST.2007.4374292     Document Type: Conference Paper

References (5)

1. McNatt, Cameron; Gaudette, Tom; "Vectorized Test Program Sets Using MATLAB and the Teradyne AI-710 Analog Test Instrument" Systems Readiness Technology Conference, IEEE Sept. 2006 Page(s):432-437.
2. Rivoir, Jochen; "Parallel Test Reduces Cost of Test More Effectively Than Just a Cheap Tester" Electronics Manufacturing Technology Symposium, 2004. IEEE/CPMT/SEMI 29th International Jul 14-16, 2004 Page(s):263-272.
3. Adachi, Toshiaki; Pramanic, Ankan; Elston, Mark; "Parallel, Multi-DUT Testing in an Open Architecture Test System" Test Conference, 2005. Proceedings. ITC 2005. IEEE International 8-10 Nov. 2005 Page(s):9 pp.
4. IEEE Std 1671™-2006; "IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML"2006 Page(s):c1-89.
5. Brandes, Ulrik; Eiglsperger, Markus; Herman, Ivan; Himsolt, Michael; Marshall, M. Scott; "GraphML Progress Report: Structural Layer Proposal" Proc. 9th Intl. Symp. Graph Drawing (GD '01), LNCS 2265, pp. 501-512. © Springer-Verlag, 2002.