Reflectance analysis of a multilayer one-dimensional porous silicon structure: Theory and experiment

Journal of Applied Physics

Volumn 104, Issue 1, 2008, Pages

  Saarinen, Jarkko J ^a   Weiss, Sharon M ^b   Fauchet, Philippe M ^c   Sipe, J E ^d  

^a LAPPEENRANTA UNIVERSITY OF TECHNOLOGY   (Finland)

^b VANDERBILT UNIVERSITY   (United States)

^c University of Rochester   (United States)

^d UNIVERSITY OF TORONTO   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION; BIREFRINGENCE; LAWS AND LEGISLATION; MULTILAYERS; NONMETALS; OPTICAL PROPERTIES; POLARIZATION; REFLECTION; SILICON;

AMERICAN INSTITUTE OF PHYSICS (AIP); ANISOTROPIC MEDIUM; EXPERIMENTAL CURVES; FRESNEL REFLECTIONS; LAYERED MEDIUM; MACRO SCALES; MULTILAYER (ML); NORMAL INCIDENCE; ONE-DIMENSIONAL; OPTICAL (PET) (OPET); OPTICAL ABSORPTION (OA); P-POLARIZED; POLARIZATION SENSITIVE; POROUS SILICON (PS); POROUS SILICON STRUCTURES; REFLECTANCE ANALYSIS; RESONANCE WAVELENGTHS;

POROUS SILICON;

EID: 47749121792     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2949265     Document Type: Article

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