A 100dB dynamic range CMOS image sensor with global shutter

Proceedings of the IEEE International Conference on Electronics, Circuits, and Systems

Volumn , Issue , 2006, Pages 1133-1136

  Labonne, Estelle ^a   Sicard, Gilles ^a   Renaudin, Marc ^a   Berger, Pierre Damien ^b  

^a TIMA LABORATORY   (France)

^b ATMEL Grenoble   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION; DETECTORS; DIGITAL CAMERAS; DIGITAL IMAGE STORAGE; IMAGE SENSORS; IMAGING TECHNIQUES; OPTICAL DESIGN; PHOTOCURRENTS; SEMICONDUCTING CADMIUM TELLURIDE; SENSORS; STANDARDS;

BASIC PRINCIPLES; CALIBRATION METHODS; CMOS IMAGE SENSOR (CIS); DISTORTION (DEFORMATION); DOUBLE SAMPLING TECHNIQUE; DYNAMIC RANGE (DR); FIXED PATTERN NOISE (FPN); HIGH DYNAMIC RANGE (HDR); INTERNATIONAL CONFERENCES; MOVING OBJECTS; PIXEL ARCHITECTURES; PROCESS VARIATIONS; REDUCTION METHODS; REFERENCE CURRENTS; STANDARD TECHNOLOGY; TEST CHIPS; THRESHOLD VOLTAGE VARIATIONS;

PIXELS;

EID: 47349129120     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICECS.2006.379639     Document Type: Conference Paper

References (10)

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