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Volumn 39, Issue 6, 2006, Pages 842-849

Structure matching: Measures of similarity and pseudosymmetry

Author keywords

Pseudosymmetry; Structure matching

Indexed keywords


EID: 33751227835     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S0021889806038489     Document Type: Article
Times cited : (23)

References (18)
  • 7
  • 9
  • 10
    • 0004150157 scopus 로고
    • Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA
    • Sheldrick, G. M. (1991). SHELXTL-Plus. Release 4.1. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.
    • (1991) SHELXTL-Plus. Release 4.1
    • Sheldrick, G.M.1
  • 18
    • 0004265370 scopus 로고    scopus 로고
    • Chemical Crystallography Laboratory, University of Oxford, England
    • Watkin, D. J. Prout, C. K. & Pearce, L. J. (1996). CAMERON. Chemical Crystallography Laboratory, University of Oxford, England.
    • (1996) CAMERON
    • Watkin, D.J.1    Prout, C.K.2    Pearce, L.J.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.