Comparative degradation of ZnO- and SnO2-based polycrystalline non-ohmic devices by current pulse stress

Journal of Physics D: Applied Physics

Volumn 41, Issue 12, 2008, Pages

  Ramirez M A ^a   Bassi, W ^b   Bueno, P R ^a   Longo, E ^a   Varela, J A ^a  

^a SÃO PAULO STATE UNIVERSITY UNESP   (Brazil)

^b UNIVERSITY OF SÃO PAULO   (Brazil)

Author keywords

[No Author keywords available]

Indexed keywords

DEGRADATION; ZINC OXIDE;

SULFATE MINERALS;

EID: 47249135395     PISSN: 00223727     EISSN: 13616463     Source Type: Journal    
DOI: 10.1088/0022-3727/41/12/122002     Document Type: Article

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