PCB loadboard design challenges for multi-gigabit devices in Automated Test Applications

International Engineering Consortium - DesignCon 2006

Volumn 3, Issue , 2006, Pages 1749-1776

  Moreira, Jose ^a   Tsai, Ming ^b   Kenton, Jonathan ^c   Barnes, Heidi ^a   Faller, Don ^a  

^a Agilent's Semiconductor Test Solutions Division   (Germany)

^b XILINX INC   (United States)

^c INTEL CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

10 GB/ S; AUTOMATED TEST; AUTOMATED TEST EQUIPMENT; COMMUNITY IS; DATA RATES; DATA SPEED; DESIGN AND SIMULATION; DESIGN CHALLENGES; DESIGN TECHNIQUE; DEVICE CHARACTERIZATION; FUNCTIONAL BEHAVIORS; MICROSTRIPES; PCB DESIGN; SIGNAL INTEGRITY; SIGNAL PATHS; SIGNAL PERFORMANCE; TRACE LENGTH;

PRINTED CIRCUIT BOARDS;

DESIGN;

EID: 47249112928     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (17)

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