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Volumn 79, Issue 2, 2002, Pages 207-210
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Chemical analysis using scanning force microscopy. An undergraduate laboratory experiment
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
CHEMICAL ANALYSIS;
CORRELATION METHODS;
FREE ENERGY;
FRICTION;
HYDROGEN BONDS;
HYDROPHILICITY;
IMAGE ANALYSIS;
INTERFACIAL ENERGY;
MOLECULAR STRUCTURE;
MONOLAYERS;
PHOTODETECTORS;
SELF ASSEMBLY;
SURFACE CHEMISTRY;
SURFACE TOPOGRAPHY;
VAN DER WAALS FORCES;
SCANNING FORCE MICROSCOPY (SFM);
SCANNING TUNNELING MICROSCOPY;
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EID: 0036465629
PISSN: 00219584
EISSN: None
Source Type: Journal
DOI: 10.1021/ed079p207 Document Type: Article |
Times cited : (23)
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References (25)
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