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Volumn 79, Issue 2, 2002, Pages 207-210

Chemical analysis using scanning force microscopy. An undergraduate laboratory experiment

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHEMICAL ANALYSIS; CORRELATION METHODS; FREE ENERGY; FRICTION; HYDROGEN BONDS; HYDROPHILICITY; IMAGE ANALYSIS; INTERFACIAL ENERGY; MOLECULAR STRUCTURE; MONOLAYERS; PHOTODETECTORS; SELF ASSEMBLY; SURFACE CHEMISTRY; SURFACE TOPOGRAPHY; VAN DER WAALS FORCES;

EID: 0036465629     PISSN: 00219584     EISSN: None     Source Type: Journal    
DOI: 10.1021/ed079p207     Document Type: Article
Times cited : (23)

References (25)
  • 1
    • 0006380439 scopus 로고    scopus 로고
    • http://www.chem.binghamton.edu/ZHONG/spm/spmmain.htm (both accessed Nov)
    • (2001)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.