Characterization and manipulation of boron nanowire inside SEM

Key Engineering Materials

Volumn 381-382, Issue , 2008, Pages 31-34

  Chang, M ^a   Lin, C H ^a   Deka, J R ^a  

^a CHUNG YUAN CHRISTIAN UNIVERSITY   (Taiwan)

Author keywords

Boron nanowire; Buckling; EBID; Nanomanipulation; Nanoring; SEM; TEM

Indexed keywords

BORON; BUCKLING; ELASTIC MODULI; MICROMANIPULATORS; NANOELECTRONICS; NANORINGS; NANOSTRUCTURED MATERIALS; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

BUCKLING INSTABILITIES; EBID; ELECTRON BEAM-INDUCED DEPOSITION; FUNDAMENTAL CHARACTERISTICS; NANO MANIPULATION SYSTEMS; NANOMANIPULATIONS; NANOSTRUCTURES MATERIALS; VAPOR-LIQUID-SOLID TECHNIQUES;

NANOWIRES;

EID: 47149105078     PISSN: 10139826     EISSN: 16629795     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/kem.381-382.31     Document Type: Article

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