메뉴 건너뛰기




Volumn 33, Issue 6, 2008, Pages 621-629

3DXRD characterization and modeling of solid-state transformation processes

Author keywords

[No Author keywords available]

Indexed keywords

INTELLIGENT SYSTEMS; MICROSTRUCTURE; MOLECULAR DYNAMICS; MONTE CARLO METHODS; NONDESTRUCTIVE EXAMINATION; STRUCTURAL DYNAMICS; X RAY DIFFRACTION;

EID: 47149104261     PISSN: 08837694     EISSN: None     Source Type: Journal    
DOI: 10.1557/mrs2008.127     Document Type: Article
Times cited : (12)

References (48)
  • 22
  • 28
    • 0006987363 scopus 로고    scopus 로고
    • N. Hansen, X. Huang, D. Juul Jensen, E.M. Lauridsen, T. Leffers, W. Pantleon, T.J. Sabin, J.A. Wert, Eds, Risø National Laboratory, Roskilde, Denmark
    • R.A. Vandermeer, Kinetic aspects of nucleation and growth in recrystallization, N. Hansen, X. Huang, D. Juul Jensen, E.M. Lauridsen, T. Leffers, W. Pantleon, T.J. Sabin, J.A. Wert, Eds. (Risø National Laboratory, Roskilde, Denmark, 2000), p. 179.
    • (2000) Kinetic aspects of nucleation and growth in recrystallization , pp. 179
    • Vandermeer, R.A.1
  • 32


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.