Integrated analysis and design of Phase-change Random Access Memory (PCRAM) cells

7th Annual Non-Volatile Memory Technology Symposium, NVMTS

Volumn , Issue , 2006, Pages 71-75

  Li, J M ^a   Shi, L P ^a   Yang, H X ^a   Lim, K G ^a   Miao, X S ^a   Lee, H K ^a   Chong, T C ^a  

^a DATA STORAGE INSTITUTE   (Singapore)

Author keywords

Design; Electric thermal mechanical analysis; PCRAM cells; Phase change; Software

Indexed keywords

CELLS; COMPUTER SOFTWARE; CYTOLOGY; DESIGN; INTEGRATED CIRCUIT DESIGN; NONVOLATILE STORAGE; PHASE CHANGE MEMORY; STRUCTURAL OPTIMIZATION;

ELECTRIC-THERMAL -MECHANICAL ANALYSIS; INTEGRATED ANALYSIS; INTEGRATED SOFTWARE; LAYER STRUCTURES; PCRAM CELLS; PHASE CHANGE; PHASE CHANGE RANDOM ACCESS MEMORY (PCRAM); STRUCTURE OPTIMIZATION;

FAILURE (MECHANICAL);

EID: 46849116633     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/nvmt.2006.378880     Document Type: Conference Paper

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