Identification of critical errors in imaging applications

Proceedings - IOLTS 2007 13th IEEE International On-Line Testing Symposium

Volumn , Issue , 2007, Pages 201-202

  Polian, Ilia ^a   Nowroth, Damian ^a   Becker, Bernd ^a  

^a UNIVERSITY OF FREIBURG   (Germany)

Author keywords

Error tolerance; Imaging applications; Low cost on line test; Selective hardening

Indexed keywords

HARDENING; IMAGE SEGMENTATION; IMAGING TECHNIQUES; KETONES; NETWORKS (CIRCUITS); PHOTOACOUSTIC EFFECT;

CIRCUIT SITES; END USERS; FAULT EFFECTS; IMAGING APPLICATIONS; INTERNATIONAL (CO); JPEG COMPRESSION; LINE TESTING; ON LINE FAULT DETECTION; ON LINE TESTING; SYSTEM BEHAVIORS;

FAULT DETECTION;

EID: 46749155063     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IOLTS.2007.38     Document Type: Conference Paper

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