Highly reliable power aware memory design

Proceedings - IOLTS 2007 13th IEEE International On-Line Testing Symposium

Volumn , Issue , 2007, Pages 189-190

  Argyrides, Costas ^a   Pradhan, Dhiraj K ^a  

^a UNIVERSITY OF BRISTOL   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

HAMMING CODES; INTERNATIONAL (CO); MEAN TIME-TO-FAILURE (MTTF); MEMORY ARCHITECTURE(MA); MEMORY DESIGNS; ON CHIPS; ON LINE TESTING; POWER SAVINGS; POWER-AWARE;

ENERGY CONSERVATION;

EID: 46749094220     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IOLTS.2007.37     Document Type: Conference Paper

References (11)

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