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Volumn , Issue , 1988, Pages 279-288
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On-chip double-bit error-correcting code for three-dimensional dynamic random-access memory
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Author keywords
[No Author keywords available]
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Indexed keywords
DATA STORAGE, DIGITAL--RANDOM ACCESS;
SEMICONDUCTOR DEVICE TESTING;
DYNAMIC RANDOM-ACCESS;
SOFT-ERROR RATE;
CODES, SYMBOLIC;
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EID: 0024121998
PISSN: 07431686
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (5)
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References (24)
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