Numerical study of the remittances of axially excited chiral sculptured zirconia thin films

Journal of Modern Optics

Volumn 55, Issue 12, 2008, Pages 1845-1857

  Babaei, Ferydon ^a   Savaloni, Hadi ^a  

^a UNIVERSITY OF TEHRAN   (Iran)

Author keywords

Bruggeman formalism; Chiral sculptured thin films; Coupled wave theory

Indexed keywords

DISPERSION (WAVES); MOTION PICTURES; NUMERICAL ANALYSIS; PERMITTIVITY; PHOTOACOUSTIC EFFECT; REFLECTION; SOLIDS; THICK FILMS; THIN FILM DEVICES; THIN FILMS; TWO PHASE FLOW; VAPOR DEPOSITION; WASTEWATER; ZIRCONIA;

BRAGG PEAKS; BRAGG WAVE LENGTH; BRUGGEMAN HOMOGENIZATION FORMALISM; CHIRAL ELEMENTS; CHIRAL FILMS; CHIRAL THIN FILMS; COUPLED-WAVE THEORY; DIELECTRIC FUNCTIONS; DISPERSION FUNCTION; EXPERIMENTAL DATA; EXPERIMENTAL RESULTS; INDIVIDUAL (PSS 544-7); NUMERICAL STUDIES; REFLECTION SPECTRUM; RELATIVE DIELECTRIC CONSTANT; SHORTER WAVELENGTHS; SPECTRA (CO); STRUCTURAL DIFFERENCES;

VOID FRACTION;

EID: 46649105098     PISSN: 09500340     EISSN: 13623044     Source Type: Journal    
DOI: 10.1080/09500340701836997     Document Type: Article

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