Simulation of reduction properties of radiated emission by on-chip decoupling capacitor

Proceedings - 6th IEEE Workshop on Signal Propagation on Interconnects, SPI

Volumn , Issue , 2002, Pages 15-18

  Sudo, Toshio ^a   Bonkohara, Manabu ^a  

^a ASSOCIATION OF SUPER ADVANCED ELECTRONICS TECHNOLOGIES ASET   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; CAPACITORS; CMOS INTEGRATED CIRCUITS; CRACK PROPAGATION; DIELECTRIC DEVICES; ELECTRIC CONVERTERS; ELECTRIC EQUIPMENT; ENERGY STORAGE; FINITE DIFFERENCE TIME DOMAIN METHOD; INTERCHANGES; SULFATE MINERALS;

CURRENT FLOWING; EXCITATION SOURCES; FDTD MODELING; GROUND BOUNCE (GB); GROUND PLANE (GP); GROUND TERMINALS; MEASUREMENT DATA; ON CHIP DECOUPLING; ON CHIPS; RADIATED EMISSION (RE); REDUCTION PROPERTIES; SIGNAL DEGRADATION; SIGNAL PROPAGATION; SIMULATION RESULTS; SIMULTANEOUS SWITCHING NOISE (SSN);

ELECTRIC CURRENTS;

EID: 46649087154     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/SPI.2002.258278     Document Type: Conference Paper

References (3)

1. Jonghoon Kim, et. al., "Effects of On-chip and Off-chip Decoupling Capacitors on Electromagnetic Radiated Emission", ECTC Proceedings, 1998.
2. Chi-Te Chen, et. al., "A Simulation Study of Simultaneous Switching Noise", ECTC Proceedings, 2001.
3. Toshio Sudo, et. al., "Characterization of On-chip Capacitance Effects for I/O Circuits and Core Circuits", Technical digest of EPEP, 2001.