Thermoplasmonic shift and dispersion in thin metal films

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

Volumn 26, Issue 4, 2008, Pages 836-841

  Lereu, A L ^a,b,e   Passian, A ^a,c   Farahi, R H ^a   Van Hulst, N F ^b,d   Ferrell, T L ^c   Thundat, T ^a,c  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b ICFO INSTITUT DE CIENCIES FOTONIQUES   (Spain)

^c UNIVERSITY OF TENNESSEE   (United States)

^d INSTITUCIÓ CATALANA DE RECERCA I ESTUDIS AVANÇATS ICREA   (Spain)

^e AIX MARSEILLE UNIVERSITÉ   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION CURVES; ABSORPTION MEASUREMENTS; ALL-OPTICAL; COUPLING SCHEMES; EXCITATION REGION; FILM TEMPERATURE; IMAGINARY PARTS; INDEX OF REFRACTION; LOW RATES; OPTIC PROPERTIES; PHOTON ENERGIES; PHYSICAL STATES; SURFACE PLASMON (SP); SURFACE PLASMON (SP) EXCITATIONS; SURFACE PLASMONS (SP); THIN METAL FILMS; THIN METALLIC FILMS; VISIBLE SPECTRUM (VIS);

ABSORPTION; DISPERSION (WAVES); ELECTRIC EXCITATION; METALLIC FILMS; METALS; MODULATION; OPTICAL DATA STORAGE; OPTICAL PROPERTIES; PLASMONS; PLATES (STRUCTURAL COMPONENTS); REFRACTIVE INDEX; SOLIDS; THICK FILMS; THIN FILM DEVICES; THIN FILMS;

SURFACE CHEMISTRY;

EID: 46449108176     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.2900713     Document Type: Article

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