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Volumn , Issue , 2007, Pages 1240-1246
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Long-term stability test system for high-voltage, high-frequency SiC power devices
a,b b b a |
Author keywords
[No Author keywords available]
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Indexed keywords
(100) SILICON;
APPLIED (CO);
BOOST CONVERTERS;
BURST SWITCHING;
DC CONVERTERS;
DESIGN CRITERION;
HIGH VOLTAGE DEVICES;
HIGH-FREQUENCY (HF);
HIGH-VOLTAGE (HV);
LONG TERM STABILITY;
MOSFETS;
POWER DEVICES;
POWER DIODES;
POWER MOSFETS;
POWER SWITCHING;
SIC DIODES;
SILICON CARBIDE (SIC);
SILICON DIODES;
SWITCHING CONDITIONS;
SWITCHING POWER CONVERTERS;
SYSTEM OPERATIONS;
TEST SYSTEMS;
DIODES;
ELECTRIC CONVERTERS;
EXHIBITIONS;
MOSFET DEVICES;
POWER CONVERTERS;
POWER ELECTRONICS;
SILICON;
SILICON CARBIDE;
SYSTEM STABILITY;
TESTING;
ELECTRONIC EQUIPMENT TESTING;
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EID: 46449085481
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/APEX.2007.357673 Document Type: Conference Paper |
Times cited : (8)
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References (11)
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