Missing dimer defect on β-SiC(0 0 1)-c(2 × 2) surface - Numerical analysis of the structure and STM profiles

Applied Surface Science

Volumn 238, Issue 1-4 SPEC. ISS., 2004, Pages 36-41

  Stankiewicz, Barbara ^a   Kamiński, Wojciech ^a   Jurczyszyn, Leszek ^a  

^a UNIVERSITY OF WROC AW   (Poland)

Author keywords

Density functional calculations; Green's function methods; Scanning tunneling microscopy; Scanning tunneling spectroscopies; Silicon carbide; Surface defects; Surface relaxation and reconstruction

Indexed keywords

CHEMICAL BONDS; DEFECTS; DIMERS; ELECTRONIC STRUCTURE; GREEN'S FUNCTION; NUMERICAL ANALYSIS; PROBABILITY DENSITY FUNCTION; RELAXATION PROCESSES; SCANNING TUNNELING MICROSCOPY; SILICON; SILICON CARBIDE; SPECTROSCOPIC ANALYSIS;

DIMER LENGTH; SCANNING TUNNELING SPECTROSCOPIES; SURFACE DEFECTS; SURFACE RELAXATION AND RECONSTRUCTION;

SURFACE STRUCTURE;

EID: 4644360413     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2004.05.236     Document Type: Conference Paper

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