Validation of equivalent circuits extracted from S-parameter data for eye-pattern evaluation

IEEE International Symposium on Electromagnetic Compatibility

Volumn 2, Issue , 2004, Pages 666-671

  Selli, Giuseppe ^a   Lai, Mauro ^a   Luan, Shaofeng ^a   Drewniak, James L ^a   Dubroff, Richard E ^a   Fan, Jun ^b   Knighten, James L ^b   Smith, Norman W ^b   Antonini, Giulio ^c   Orlandi, Antonio ^c   Archambeault, Bruce ^d   Connor, Samuel ^d  

^a MISSOURI UNIVERSITY OF SCIENCE AND TECHNOLOGY   (United States)

^b NCR CORPORATION   (United States)

^c UNIVERSITY OF L'AQUILA   (Italy)

^d IBM RESEARCH   (United States)

Author keywords

Accuracy; Circuit extraction; Complexity; Eye diagrams; Model order; Model validation

Indexed keywords

ACCURACY; CIRCUIT EXTRACTION; COMPLEXITY; EYE-DIAGRAMS; MODEL ORDER; MODEL VALIDATION;

ANALOG DIFFERENTIAL ANALYZERS; COMPUTER SIMULATION; FREQUENCY DOMAIN ANALYSIS; IMPULSE RESPONSE; INTERCONNECTION NETWORKS; MATHEMATICAL MODELS; MICROSTRIP LINES;

EQUIVALENT CIRCUITS;

EID: 4644339762     PISSN: 10774076     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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