Classification on defective items using unidentified samples

Pattern Recognition

Volumn 38, Issue 1, 2005, Pages 51-58

  Li, Tze Fen ^a   Chang, Shui Ching ^a  

^a NATIONAL CHUNG HSING UNIVERSITY   (Taiwan)

Author keywords

Bayes decision rule; Classification; empirical bayes; Exponential distribution; Quality control; Stochastic approximation; Unsupervised learning

Indexed keywords

APPROXIMATION THEORY; DECISION THEORY; PROBABILITY; QUALITY CONTROL; RANDOM PROCESSES; STATISTICAL METHODS;

BAYES DECISION RULE; EXPONENTIAL DISTRIBUTION; STOCHASTIC APPROXIMATION; UNSUPERVISED LEARNING;

PATTERN RECOGNITION;

EID: 4644323253     PISSN: 00313203     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.patcog.2004.05.008     Document Type: Article

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