Bayesian analysis for masked system failure data using non-identical Weibull models

Journal of Statistical Planning and Inference

Volumn 78, Issue 1-2, 1999, Pages 255-275

  Basu, Sanjib ^a   Basu, Asit P ^b   Mukhopadhyay, Chiranjit ^c  

^a NORTHERN ILLINOIS UNIVERSITY   (United States)

^b UNIVERSITY OF MISSOURI   (United States)

^c INDIAN INSTITUTE OF SCIENCE   (India)

Author keywords

Adaptive rejection; Competing risks; Gibbs sampling; Log concave densities; Masking; Weibull distribution

Indexed keywords

EID: 0033130543     PISSN: 03783758     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0378-3758(98)00218-3     Document Type: Article

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