An automated and rapid defect inspection algorithm for fluorescent PDP patterns

Canadian Conference on Electrical and Computer Engineering

Volumn 1, Issue , 2001, Pages 213-218

  Ge, R ^a   Clausi, D A ^a  

^a UNIVERSITY OF WATERLOO   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; FLUORESCENCE; FOURIER TRANSFORMS; IMAGE CODING; PATTERN RECOGNITION; QUALITY CONTROL;

PLASMA DISPLAY PANELS (PDP);

PLASMA DISPLAY DEVICES;

EID: 0034845402     PISSN: 08407789     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (3)