High dielectric constant thin film embedded capacitor for suppression of simultaneous switching noise and radiated emission

IEEE International Symposium on Electromagnetic Compatibility

Volumn 2, Issue , 2004, Pages 588-591

  Kim, Hyungsoo ^a   Park, Hyunjeong ^a   Jeong, Youchul ^a   Kim, Joungho ^a   Kyu Lee, Seok ^b   Kuk Hong, Jong ^b   Hong, Youngsoo ^c  

^a Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

^b Samsung Electro Mechanics   (South Korea)

^c SAMSUNG Electronics   (South Korea)

Author keywords

Component; embedded capacitor; High dielectric constant; Power ground impedance; Radiated emission; SSN

Indexed keywords

COMPONENT; EMBEDDED CAPACITORS; HIGH DIELECTRIC CONSTANTS; POWER/GROUND IMPEDANCE; RADIATED EMISSION; SSN;

CAPACITORS; CMOS INTEGRATED CIRCUITS; ELECTRIC IMPEDANCE; HARMONIC ANALYSIS; PERMITTIVITY; PRINTED CIRCUIT BOARDS; RADIATION; SCANNING ELECTRON MICROSCOPY; SPURIOUS SIGNAL NOISE; SWITCHING THEORY;

THIN FILMS;

EID: 4644275097     PISSN: 10774076     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)

1. Smith, L.D.; Anderson, R.E.; Forehand, D.W.; Pelc, T.J.; Roy, T, "Power distribution system design methodology and capacitor selection for modern CMOS technology," Advanced Packaging, IEEE Transactions on, Volume: 22 Issue: 3, Aug. 1999
2. Joseph M. Hobbs, Hitesh Windlass, Venky Sundaram, Sungjun Chun, George E. White, Madhavan Swaminathan, Rao R. Tummala, "Simultaneous Switching Noise Suppression for High Speed Systems Using Embedded Decoupling", 2001 Electronic Components and Technology Conference, 2001.
3. W.D. Becker et al.,"Modeling, simulation and measurement of mid-frequency simultaneous switch noise in computer systems", IEEE Trans. Comp., Package and Manufacture. Technology B, vol. 21, pp. 286-297, May 1998.
4. M. Xu, T.H. Hubing, J. Chen, T.P. Van Doren, J.L. Drewnial, and R.E. DuBroff, "Power-Bus Decoupling with Embedded Capacitance in Printed Circuit Board Design", IEEE Trans on EMC, vol. 45, no. 1, pp 22-30, February 2003.
5. Istvan Novak, "Measuring Milliohms and PicoHenrys in Power-Distribution Networks", 2000 High-Performance System Design Conference