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Volumn 412-414, Issue SPEC. ISS., 2004, Pages 1442-1446

Nb/AlOx/Nb junctions fabricated using ECR plasma etching

Author keywords

Anodization; ECR plasma etching; Nb AlOx Nb; Plasma induced damage

Indexed keywords

ANODIC OXIDATION; CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); CURRENT VOLTAGE CHARACTERISTICS; ELECTRON CYCLOTRON RESONANCE; LITHOGRAPHY; PLASMA ETCHING; RESISTORS; SCANNING ELECTRON MICROSCOPY; SPUTTERING;

EID: 4644262046     PISSN: 09214534     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physc.2004.01.150     Document Type: Conference Paper
Times cited : (5)

References (11)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.