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Volumn 412-414, Issue SPEC. ISS., 2004, Pages 1442-1446
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Nb/AlOx/Nb junctions fabricated using ECR plasma etching
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Author keywords
Anodization; ECR plasma etching; Nb AlOx Nb; Plasma induced damage
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Indexed keywords
ANODIC OXIDATION;
CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY);
CURRENT VOLTAGE CHARACTERISTICS;
ELECTRON CYCLOTRON RESONANCE;
LITHOGRAPHY;
PLASMA ETCHING;
RESISTORS;
SCANNING ELECTRON MICROSCOPY;
SPUTTERING;
ECR PLASMA ETCHING;
NB/ALOX/NB;
PLASMA INDUCED DAMAGES;
NIOBIUM;
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EID: 4644262046
PISSN: 09214534
EISSN: None
Source Type: Journal
DOI: 10.1016/j.physc.2004.01.150 Document Type: Conference Paper |
Times cited : (5)
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References (11)
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