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Volumn 300, Issue , 2004, Pages 125-129

Time-domain terahertz spectroscopy of SrBi2Ta2O 9

Author keywords

Central mode; Ferroelectric; Soft mode; Strontium bismuth tantalate; Terahertz time domain spectroscopy

Indexed keywords

CERAMIC MATERIALS; FERROELECTRIC MATERIALS; LIGHT REFLECTION; PHASE TRANSITIONS; SPECTROSCOPIC ANALYSIS; THIN FILMS;

EID: 4644261168     PISSN: 00150193     EISSN: 15635112     Source Type: Conference Proceeding    
DOI: 10.1080/00150190490443785     Document Type: Article
Times cited : (6)

References (11)
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    • M. C. Nuss and J. Orenstein, Terahertz time-domain spectroscopy, In Millimeter and Submillimeter Wave Spectroscopy of Solids (G. Grüner, ed.), Chap. 2, Springer-Verlag Berlin Heidelberg, pp. 7-50 (1998).
    • (1998) Millimeter and Submillimeter Wave Spectroscopy of Solids , pp. 7-50
    • Nuss, M.C.1    Orenstein, J.2
  • 2
    • 0343391123 scopus 로고    scopus 로고
    • Time-resolved terahertz transmission spectroscopy of dielectrics
    • P. Kužel, and J. Petzelt, Time-resolved terahertz transmission spectroscopy of dielectrics. Ferroelectrics 239, 949-956 (2000).
    • (2000) Ferroelectrics , vol.239 , pp. 949-956
    • Kužel, P.1    Petzelt, J.2
  • 3
    • 0013013021 scopus 로고    scopus 로고
    • Time-resolved and backward-wave oscillator submillimetre spectroscopy of some ferroelectric ceramics and thin films
    • A. Pashkin, P. Kužel, J. Petzelt, B. Gorshunov, and M. Dressel, Time-resolved and backward-wave oscillator submillimetre spectroscopy of some ferroelectric ceramics and thin films. Ferroelectrics 272, 219-224 (2002).
    • (2002) Ferroelectrics , vol.272 , pp. 219-224
    • Pashkin, A.1    Kužel, P.2    Petzelt, J.3    Gorshunov, B.4    Dressel, M.5
  • 5
  • 7
    • 0030230561 scopus 로고    scopus 로고
    • A reliable method for extraction of material parameters in terahertz time-domain spectroscopy
    • L. Duvillaret, F. Garet, and J.-L Coutaz, A reliable method for extraction of material parameters in terahertz time-domain spectroscopy. IEEE J. Select. Topics Quantum Electron. 2, 739-746 (1996).
    • (1996) IEEE J. Select. Topics Quantum Electron. , vol.2 , pp. 739-746
    • Duvillaret, L.1    Garet, F.2    Coutaz, J.-L.3
  • 8
    • 0035576090 scopus 로고    scopus 로고
    • Characterization of the electrical properties and thickness of thin epitaxial semiconductor layers by THz reflection spectroscopy
    • D. Hashimshony, I. Geltner, G. Cohen, Y. Avitzour, A. Zigler, and C. Smith, Characterization of the electrical properties and thickness of thin epitaxial semiconductor layers by THz reflection spectroscopy. J. Appl. Phys. 90, 5778-5781 (2001).
    • (2001) J. Appl. Phys. , vol.90 , pp. 5778-5781
    • Hashimshony, D.1    Geltner, I.2    Cohen, G.3    Avitzour, Y.4    Zigler, A.5    Smith, C.6
  • 9
    • 0032072197 scopus 로고    scopus 로고
    • Optical mode softening of ferroelectric SrBiiTajOs and related bismuth layer-structured oxides
    • S. Kojima, Optical mode softening of ferroelectric SrBiiTajOs and related bismuth layer-structured oxides. J. Phys.: Condens. Matter 10, L327-L332 (1998).
    • (1998) J. Phys.: Condens. Matter , vol.10
    • Kojima, S.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.