Effects of nonmodel errors on model-based testing

IEEE Transactions on Instrumentation and Measurement

Volumn 45, Issue 2, 1996, Pages 384-388

  Stenbakken, Gerard N ^a,b  

^a IEEE

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; COMPUTER SOFTWARE; DATA STRUCTURES; MATHEMATICAL MODELS; MEASUREMENT ERRORS; RELIABILITY;

NONMODEL ERRORS; SET OF MEASUREMENTS; TEST MEASUREMENTS;

EQUIPMENT TESTING;

EID: 0030129186     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/19.492752     Document Type: Article

References (8)

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2. G. N. Stenbakken and T. M. Souders, "Test point selection and testability measures via QR factorization of linear models,"IEEE Trans. Instrum. Meas., vol. IM-36, pp. 406-410, June 1987.
3. T. M. Souders and G. N. Stenbakken, "A comprehensive approach for modeling and testing analog and mixed-signal devices," in 1990 IEEE Int. Test Conf. Proc., IEEE Computer Society Press, Sept. 1990, pp. 169-176.
4. G. N. Stenbakken and T. M. Souders, "Linear error modeling of analog and mixed-signal devices," in 1991 Int. Test Conf. Proc., IEEE Computer Society Press, Sept. 1991, pp. 573-581.
5. A. D. Koffman and T. M. Souders, "Application of the NIST testing strategies to a multirange instrument," in 1994 Meas. Science Conf. Proc., Jan. 1994, Session 1-B.
6. G. N. Stenbakken and T. M. Souders, "Developing linear error models for analog devices,"IEEE Trans. Instrum. Meas., vol. 43, no. 2, pp. 157-163, Apr. 1994
7. J. T. G. Hwang and H. Liu, "Asymptotic theory for prediction through empirical linear model," in Spring Research Conference: ASA 1994 Proceedings, 1994, pp. 207-216.
8. J. T. G. Hwang and H. Liu, "Application of empirical linear prediction to quality assurance in industrial manufacturing," in Physical and Engineering Science: Proc. 1994 Joint Statistical Meetings, ASA, 1994, pp. 175-180.