New method for determination of the optical constants and thickness of thin film

Guangxue Xuebao/Acta Optica Sinica

Volumn 24, Issue 7, 2004, Pages 885-889

  Shen, Weidong ^a   Liu, Xu ^a   Ye, Hui ^a   Gu, Peifu ^a  

^a ZHEJIANG UNIVERSITY   (China)

Author keywords

Dispersion equation; Downhill simplex method; Optical constants of thin film; Thin film optics

Indexed keywords

CURVE FITTING; ELECTROMAGNETIC DISPERSION; GLOBAL OPTIMIZATION; OPTICAL COATINGS; OPTICAL PROPERTIES; SILICON NITRIDE; THICKNESS MEASUREMENT; TITANIUM DIOXIDE;

CAUTHY FORMULA; DISPERSION EQUATIONS; DOWNHILL SIMPLEX METHOD; DRUDE FORMULA; OPTICAL CONSTANTS; THIN FILM THICKNESS; TRANSMISSION SPECTRUM;

OPTICAL FILMS;

EID: 4644255792     PISSN: 02532239     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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